The SKYSCAN 1273 sets a new standard for non-destructive testing (NDT) with benchtop instruments, providing a performance previously only achieved by floor standing systems.
It is a High Capacity 3D X-ray Microscopy that can sample up to 500 mm length, 300 mm diameter, and a maximum weight of 20 kg. The combination of a higher-energy X-ray source running at higher power and a large format flat-panel detector
with ultimate sensitivity and readout speed provides excellent image quality in just a few seconds. High Capacity 3D X-ray Microscopy is a cutting-edge imaging technique that allows scientists and researchers to explore the microscopic world in three dimensions with remarkable detail. It involves the use of X-rays to create high-resolution images of objects at the nanoscale.
The “high capacity” aspect refers to the system’s ability to handle large volumes of data efficiently, enabling the reconstruction of three-dimensional structures with intricate precision. In simpler terms, imagine looking at an object through a powerful microscope, but instead of just seeing a flat image, you can examine it from all angles and depths.
This capability is invaluable in various scientific fields, such as materials science, biology, and geology, as it enables researchers to visualize and analyze complex structures in unprecedented detail.
High Capacity 3D X-ray Microscopy has the potential to revolutionize our understanding of tiny structures, leading to advancements in areas like medical diagnostics, material design, and fundamental scientific research.
Further Reading
Sources
- “An overview of 3D X-ray microscopy” https://analyticalscience.wiley.com/content/news-do/overview-3d-x-ray-microscopy_1
- “X-Ray Microscopy Analysis (XRM) Of Fiber-Reinforced Composite Materials” https://www.azom.com/article.aspx?ArticleID=8530
- “X-ray Microscopy: An Overview” https://www.azolifesciences.com/article/X-ray-Microscopy-An-Overview.aspx
- Cloetens, P., Pateyron-Salomé, M., Buffière, J. Y., Peix, G., Baruchel, J., Peyrin, F., & Schlenker, M. (1996). Observation of microstructure and damage in materials by phase sensitive radiography and tomography. Journal of Applied Physics, 81(9), 5878-5886.
- Pfeiffer, F., Weitkamp, T., Bunk, O., & David, C. (2006). Phase retrieval and differential phase-contrast imaging with low-brilliance X-ray sources. Nature Physics, 2(4), 258-261.
- Mokso, R., Marone, F., Haberthür, D., Schittny, J. C., & Stampanoni, M. (2013). FreeX: a user-friendly, high-throughput interface for tomography data processing. Journal of Synchrotron Radiation, 21(6), 1330-1337.
- “‘The Curse of Oak Island’ Just Snagged a New Expert — Let’s Meet Emma Culligan!” https://www.distractify.com/p/who-is-emma-culligan-curse-of-oak-island
